文档介绍：片上网络FIFOs的内建自测试方法研究*
赵建武,师奕兵,王志刚
(电子科技大学自动化工程学院成都 610054)
摘要:片上网络是对微系统芯片的传统片上互连结构的统一和发展,一种新的集成电路设计技术只有在它的测试技术发展完善后才能被广泛使用。首先建立了片上网络路由器FIFOs的功能模型,在此基础上,提出了一种基于可测性设计技术并且具有线性计算复杂度O(n)的FIFOs测试算法,论述了一种新颖的复用片上网络、共享内建自测试(BIST)结构对片上网络路由器FIFOs并行测试的方法。实验数据分析表明这种测试方法具有较高的故障覆盖率、较小的测试时间和片上资源开销。
关键词:微系统芯片; 片上网络; FIFOs; 内建自测试; 可测性设计
中图分类号:TN407 文献标识码:A 国家标准学科分类代码:
Research on BIST test method work-on-chip FIFOs
Zhao Jianwu, Shi Yibing, Wang Zhigang
(School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China)
work-on-chip has recently emerged as a unification of current trends of on-chip munication infrastructure plex system-on-chip. Any new design methodology will only be widely adopted if it plemented by efficient test mechanism. In this paper, we describe the functional model of FIFOs used in NoC routers and propose a novel FIFOs test algorithm based on design for testing technique to reduce the plexity to O(n). We discuss a method of progressive reuse of the on-work to transport test data and sharing built-in self-test circuit to test the router FIFOs under test. Experiment results show that the method has the advantage of high fault coverage, short test time and low chip area overhead.
Key words:system-on-chip; network-on-chip; FIFO; built-in self-test; design for testing
1 引言
微系统芯片(system-on-chip)的设计技术在近几年得到了飞速的发展