文档介绍：毕业论文(设计)
题目: 存储器测试仪软件设计
系部名称: 信息工程系专业班级: 电气091
学生姓名: 陈享学号: 200907084107
指导教师: 郭振铎教师职称: 讲师
2013 年 5 月 28日

摘要
随着当前移动存储技术的快速发展和移动存储市场的高速扩大,FLASH型和E2不要写简写
型存储器的用量迅速增长。FLASH芯片由于其便携、可靠、成本低等优点,在移动产品中非常适用。市场的需求催生了一大批FLASH和E2芯片研发、生产、应用企业。为保证芯片长期可靠的工作,这些企业需要在产品出厂前对FLASH和E2存储器进行高速和细致地测试,因此,高效FLASH存储器测试算法的研究就显得十分必要。任何存储器测试的基本方法是,往存储器写入一些数据,然后根据内存设备的地址,校验读回的数据。如果所有读回的数据和那些写入的数据是一样的,那么就可以说存储设备通过了测试。只有通过认真选择的一组数据你才可以确信通过的结果是有意义的。存储器测试的目的是确认在存储设备中的每一个存储位置都在工作。用词不准确。
本设计是以STM32F101为控制核心,通过外围的不同模块可以让实现一个存储器测试系统。系统主要由以下几个部分组成:单片机,显示模块,时钟模块,键盘模块,测试烧录座模块,通信模块。其中MCU采用的是STM32F101芯片;显示模块为12864液晶显示;用PHILIPS公司的PCF8563向单片机读取包括秒、分、时、日、月、年等在内的实时时间信息;通信模块为RS-232;通过所学的应用软件Altium Designer 6和Keil uVision4进行绘图及编程。最后焊接才完整电路,并且调试运行。
关键词:存储器测试系统,查下信商论文格式规范,到底是空格还是逗号还是分号。中英文要统一
STM32F101单片机,12864显示,PCF8563时钟,RS232通信
Title(Memory test software design)
Abstract
With the current rapid development of mobile storage technology and the rapid expansion of mobile storage market, FLASH type and E2 type memory usage growing rapidly. FLASH chip because of its portability, reliability, and low cost, ideal for mobile products. Spawned a large market demand and E2 FLASH chip development, production, application enterprises. To ensure long-term reliable chip work, panies need in the factory before the FLASH memory speed and E2 and meticulous testing, therefore, efficient FLASH memory test algorithm is very necessary. Any memory test basic method is to write some data to the memory, then the memory address of the device, check the data read back. If all data is read back, and those written data is the same, then it can be said that the storage device passed the test. Only by careful selection of a set of data before you can be sure that the results are meaningful through. The purpose of the test is to confirm the memory storage devices in each of the memory locations are at work.
The design is based on STM32F101 as the control center through the different peripheral module allows the realization of