文档介绍：Microelecrron. Reliab., Vol. 37, No. 8, pp. 1 165-1 168, 1997
Pergamon 0 1997 Elsevier Science Ltd
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BAYESIAN INFERENCE FOR PARTIALLY ACCELERATED
LIFE TESTS USING GIBBS SAMPLING
MOHAMED T. MAD1
Department of Statistics, United Arab Emirates University, 17555, Al-Ain,
United Arab Emirates
(Received for publication 19 July 1996)
Abstract-We consider a life testing situation in which several groups of items are put, at different
instances, on the partially accelerated life test proposed by DeGroot and Goel [Naval Research Logistics
Quarterly, 1979. 26, 223-2351, bined failure time data are then used to derive empirical Bayes
estimators for the failure of the exponential life length under normal conditions. The estimation which
is implemented using the Gibbs sampler Monte-Carlo-based approach, illustrates once again the ease with
which these new types of estimation problems often requiring sophisticated numerical or analytical
expertise, can be handled using the sampling based approach. 0 1997 Elsevier Science Ltd.
1. INTRODUCTION estimate the parameters of interest. As shown in
Section 2 of this article, the Bayesian empirical Bayes
Accelerated life testing (ALT) of a product under
estimation of the failure rate at use c