(The Springer International Series in Engineering and Computer Science 140) Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil (auth.)-Neural Models and Algorithms for Digital Testing-S.pdf

文档介绍：NEURAL MODELS AND
ALGORITHMS FOR
DIGITAL TESTING
THE KLUWER INTERNATIONAL SERIES
IN ENGINEERING AND
COMPUTER SCIENCE
VLSI, COMPUfER ARCHITECI1JRE AND
DIGITAL SIGNAL PROCESSING
Consulting Editor
Jonathan Allen
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