文档介绍：Journey to Data Quality
Yang W. Lee
Leo L. Pipino
James D. Funk
Richard Y. Wang
Journey to Data Quality
Journey to Data Quality
Yang W. Lee, Leo L. Pipino, James D. Funk, and
Richard Y. Wang
The MIT Press
Cambridge, Massachusetts
London, England
( 2006 Massachusetts Institute of Technology
All rights reserved. No part of this book may be reproduced in any form by any
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This book was set in Sabon on 3B2 by Asco Typesetters, Hong Kong. Printed
and bound in the United States of America.
Library of Congress Cataloging-in-Publication Data
Journey to data quality / Yang W. Lee . . . [et al.].
p. cm.
Includes bibliographical references and index.
ISBN 10: 0-262-12287-1—ISBN 13: 978-0-262-12287-0 (alk. paper)
1. Business—Data processing—Management. 2. Database management—
Quality control. I. Lee, Yang W.
2006
—dc22 2006043331
**********
Contents
Preface ix
Acknowledgments xi
1 Introduction 1
Can Information Be Shared? 2
A New System Is Not the Answer 3
Starting the Data Quality Journey 5
Stories of essful Beginnings 6
The CEO Leads the Journey 7
The Challenges of the Journey 8
Data Quality: Why Is It Important? 9
Overview of the Book 10
2 Cost/Benefit Analysis 13
The Challenge 13
The Cost/Benefit Trade-off 15
A Case Example 18
Further Cost/Benefit Analysis Techniques 21
Concluding Remarks 25
3 Assessing Data Quality, Part I 27
Assessment Techniques and Associated Approaches 28
Assessment Approaches in Practice 29
Gap Analysis Techniques 34
Data Integrity Assessment 38
Co