文档介绍：System-on-Chip(SoC)TestingAnIntroductionandOverviewofIEEE1500StandardTestabilityMethodforEmbeddedCore-basedICs1WhatisaSoC?:HigherperformanceLowerPowerconsumptionSmallervolumeandweightTypically,heterogeneous,containingamixof:DigitallogicMemoriesofdifferentformatsandtypesAnalogcircuitsEmbeddedcores2Whatisacore?Large,reusablebuildingblocksReusespeedsupdesign,:CPUsandDSPsSerialinterfacesModulesforinterconnectstandards,,USB,IEEE1394(Firewire),putation,:Soft(RTLcode)list)hard(layout):Intraditionalsystem-on-ponentswereICs,designed,manufactured,-(soft,firm,orhard),,coreproviderassistsbydeliveringpre- EmbeddedCoreTest*StatedPurpose:Reducetestcostthroughimprovedautomation,promotegooddesign-for-test(DFT)technique,-accessmechanisms(TAMs)andaninstructionsetfortestingcores,SoCinterconnect,://grouper./groups/1500/,.,JournalofElectronicTesting:TheoryandApplications(JETTA),18,365-383,:WIRshift,thenWIRUpdate10