文档介绍：Measurement of Power Devices
Using External DC Power Supply
Application Note 4156-5
HP 4155B / 4156B
Semiconductor
ParameterAnalyzer
Expansion of measurement range to cover several
amperes easily achieved using external DC power
supply
1
Introduction Shield Box
If used bination with an INTLK
external DC power supply, the INTLK
SMU 1
HP 4155B/4156B semiconductor Vg
parameter analyzer can easily
Cv+ SMU 2
evaluate the DC characteristics of
D + Vvp
A1
a power device that requires a VMU 1
current of several amperes. This V Vim
A3
G
application note describes how to - VMU 2
connect the highly cost-effective
S A6
HP E3615A DC power supply to To C om mo n HP 4155B
the HP 4155B and to use the HP E3615A
HP 4155B's automatic analysis HP 16495H/J
Connector Plate
functions to automatically
calculate threshold voltage (Vth). Figure 1. Diagram of Connections for Power Transistor Measurement
CHANNEL S: CHANNEL DEFI NI T I ON 9 4 OCT 0 5 0 5 : 1 5 PM
Power transistor V
measurement
* MEASUREMENT MODE
SWEEP I
Curve tracers are widely used for *CHANNELS
power transistor measurement, MEASURE STBY SERI ES
UNI T VNAME I NAME MODE FCTN RESI STANCE VPULSE
but have few analysis functions SMU1 : MP Vg I g VPULSE VAR2 0 o hm
and have difficulty in extracting SMU2 : MP Vv p I v p V VAR1 0 o hm
SMU3: MP
IPULSE
transistor parameters. They al