文档介绍：Advances in Pattern Recognition
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Stan Z. Li
Markov Random Field
Modeling in Image Analysis
Third Edition
123
Stan Z. Li
Center for Biometrics and Security Research &
National Laboratory of Pattern Recognition
Institute of Automation
Chinese Academy of Science
Beijing 100190, China
@
Series editor
Professor Sameer Singh, PhD
Research School of Informatics, Loughborough University, Loughborough, UK
ISBN: 978-1-84800-278-4 e-ISBN: 978-1-84800-279-1
DOI: -1-84800-279-1
Advances in Pattern Recognition Series ISSN 1617-7916
British Library Cataloguing in Publication Data
A catalogue record for this book is available from the British Library
Library of Congress Control Number: 2008943235
∈c Springer-Verlag London Limited 2009
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