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C62.45-2002 Ieee Recommended Practice On Surge Testing For Equipment Connected To Low-Voltage (1000 V And Less) Ac Power Circuits.pdf

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C62.45-2002 Ieee Recommended Practice On Surge Testing For Equipment Connected To Low-Voltage (1000 V And Less) Ac Power Circuits.pdf

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C62.45-2002 Ieee Recommended Practice On Surge Testing For Equipment Connected To Low-Voltage (1000 V And Less) Ac Power Circuits.pdf

文档介绍

文档介绍:IEEE Std ™-2002
(Revision of IEEE Std -1992)

IEEE mended Practice on Surge
Testing for Equipment Connected to
Low-Voltage (1000 V and Less) AC
Power Circuits
IEEE Power Engineering Society
Sponsored by the
Surge Protective mittee
EEE Standards
IEEE Standards
I
Published by
The Institute of Electrical and Electronics Engineers, Inc.
3 Park Avenue, New York, NY 10016-5997, USA
Print: SH95060
11 April 2003 PDF: SS95060
Recognized as an IEEE Std ™-2002
American National Standard (ANSI) (Revision of
IEEE Std -1992)
IEEE mended Practice on Surge
Testing for Equipment Connected to
Low-Voltage (1000 V and Less) AC
Power Circuits
Sponsor
Surge Protective mittee
of the
Power Engineering Society
Approved 10 March 2003
American National Standards Institute
Approved 11 November 2002
IEEE-SA Standards Board
IEEE thanks the International mission (IEC) for permission to reproduce information
from its International Standard, IEC 61000-4-4 (1995)—Figure 18 and Figure 19. All such excerpts are
copyright of IEC, Geneva, Switzerland. All rights reserved. Further information on the IEC is available from
. IEC has no responsibility for the placement and context in which the excerpts and
contents are reproduced by IEEE; nor is IEC in any way responsible for the other content or accuracy
therein.
Abstract: The scope of this mended practice is the performance of surge testing on electrical
and electronic equipment connected to low-voltage ac power circuits, specifically using the
mended test waveforms defined in IEEE Std ™-2002. Nevertheless, these
mendations are applicable to any surge testing, regardless of the specific surges that may be
applied.
Keywords: low-voltage ac power circuit, surge testing, surge withstand level
The Institute of Electrical and Electronics Engineers, Inc.
3 Park Avenue, New York, NY 10016-5997, USA
Copyright © 2003 by the Institute of Electrical and Electro

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