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Ieee Std c62.38-1994 (Ieee Guide On Electrostatic Discharge (Esd); Esd Withstand Capability Evaluation Methods (For Electronic Equipment Subassemblies)).pdf

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Ieee Std c62.38-1994 (Ieee Guide On Electrostatic Discharge (Esd); Esd Withstand Capability Evaluation Methods (For Electronic Equipment Subassemblies)).pdf

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Ieee Std c62.38-1994 (Ieee Guide On Electrostatic Discharge (Esd); Esd Withstand Capability Evaluation Methods (For Electronic Equipment Subassemblies)).pdf

文档介绍

文档介绍:WITHDRAWN
IEEE Std ™-1994 (Withdrawn 2005)
IEEE Guide on Electrostatic
Discharge (ESD): ESD Withstand
Capability Evaluation Methods
(for Electronic Equipment
Subassemblies)
Sponsor
Surge-Protective mittee
of the
IEEE Power Engineering Society
Withdrawn 25 January 2005
IEEE-SA Standards Board
Abstract: This guide establishes test methods for the evaluation of ESD withstand capability for electronic
equipment subassemblies. It includes information about test conditions, test equipment, and test procedures
for ESD tests of printed circuit boards and oter subassemblies.
Keywords: electronic equipment subassemblies, electrostatic discharge, ESD, subassemblies, withstand ca-
pability
* Withdrawn standards are standards are no longer useful or contain significant obsolete or erroneous infor-
mation. All amendments or corrigenda associated with this standard have also been withdrawn. This stan-
dard has been withdrawn as an American National Standard (ANSI).
WARNING: In using this standards, you do so AT YOUR OWN RISK, as the technology contained herein
may contain significant obsolete or erroneous information, or may have been superseded since the date of
withdrawal. IEEE neither represents nor warrants that any information in this standard is either useful, in use
by industry, current, without error, or applicable for any particular purpose.
Information on withdrawn standards is available in the IEEE-SA Standards Board Operations Manual
<http://standards./guides/opman/>.
WITHDRAWN
The Institute of Electrical and Electronics Engineers, Inc.
3 Park Avenue, New York, NY 10016-5997, USA
Copyright © 1995 by the Institute of Electrical and Electronics Engineers, Inc.
All rights reserved. Published 1995 Printed in the United States of America.
IEEE is a registered trademark in the . Patent & Trademark Office, owned by the Institute of Electrical and Electronics
Engineers, Incorporated.
ISBN 1-55937-471-3
No part of this p