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IEEE-STD-943-1986 (ANSI) IEEE Guide for Aging Mechanisms and Diagnostic Procedures in Evaluating Electrical Insulation Systems.pdf

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IEEE-STD-943-1986 (ANSI) IEEE Guide for Aging Mechanisms and Diagnostic Procedures in Evaluating Electrical Insulation Systems.pdf

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IEEE-STD-943-1986 (ANSI) IEEE Guide for Aging Mechanisms and Diagnostic Procedures in Evaluating Electrical Insulation Systems.pdf

文档介绍

文档介绍:ANSI/IEEE Std 943-1986
IEEE Guide for Aging Mechanisms and
Diagnostic Procedures in Evaluating
Electrical Insulation Systems
Published by The Institute of Electrical and Electronics Engineers, Inc 345 East 47th Street, New York, NY 10017, USA
Ailgust 22%1986 SH10629
ANSI/IEEE
Std 943-1986
An American National Standard
IEEE Guide for Aging Mechanisms and
Diagnostic Procedures in Evaluating
Electrical Insulation Systems
Sponsor
IEEE Standards mittee 4,
Thermal Rating
Approved June 13,1985
IEEE Standards Board
Approved November 15, 1985
American National Standards Institute
@ Copyright 1986
The Institute of Electrical and Electronics Engineers, Inc
345 East 47th Street, New York, NY 10017, USA
No part of this publication may be reproduced in anyform,
in an electronic retrieval system OT otherwise,
without priar written permission of th,e publisher.
IEEE Standards documents are developed within the -
mittees of the IEEE Societies and the Standards mit-
tees of the IEEE Standards Board. Members of mittees serve
voluntarily and pensation. They are not necessarily mem-
bers of the Institute. The standards dteveloped within IEEE represent
a consensus of the broad expertise on the subject within the Institute
as well as those activities outside of IEEE which have expressed an in-
terest in participating in the development of the standard.
Use of an IEEE Standard is wholly voluntary. The existence of an
IEEE Standard does not imply that there are no other ways to pro-
duce, test, measure, purchase, market, or provide other goods and ser-
vices related to the scope of the IEEE Standard. Furthermore, the view-
point expressed at the time a standard is approved and issued is subject
to change brought about through developments in the state of the art
ments received from users of the standard. Every IEEE Stan-
dard is subjected to review at least once every five years for revi

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