文档介绍：I
原子力显微镜在材料科学研究中的应用
摘要
此论文简要叙述了原子力显微镜的工作原理及特点,介绍其在材料科学中的应用,
指出原子力显微镜在材料的研究过程中有广阔得应用前景。原子力显微镜为扫描探针显
微镜家族的一员,具有纳米级的分辨能力,其操作容易简便,是目前研究纳米科技和材
料分析的最重要的工具之一。原子力显微镜是利用探针和样品间原子作用力的关系来得
知样品的表面形貌。至今,原子力显微镜已发展出许多分析功能,原子力显微技术已经
是当今科学研究中不可缺少的重要分析仪器。
关键词:原子力显微镜,材料,扫描探针,表面形貌
II
Application of Atomic Force Microscope in Material Research
ABSTRACT
The priciple and character of atomic force microscope is depicted by this article and we
also introduced the application of atomic force microscope. Great superiority and potential of
application in field of material is showed. Atomicforce microscope is number of the scanning
probe microscope family. It is capable of generating 3D images of surface topography with
nanometer. Also it will be operated easily. Consequently,it is the most useful instrument
which can be utilized for nanometer technology and material research at present. atomic force
microscope scans the surface by the force of atomic range, which generated by the probe and
the specimens. Nowadays the atomicforce microscope have owned many analytical functions.
And the atomic force microscopic technology is indispensable in the technological research
currently.
KEY WORDS: atomic force microscope,material,scanning probe,surface topography
III
目录
摘要........................................................................................................................................... I
ABSTRACT...............................................................................................................................II
1 原子力显微镜的基本知识.....................................................................................................1
显微技术概述..............................................................................................................1
前言...................................................................................................................1
原子力显微镜(AFM)综述...........................................