文档介绍：puting with Nano-scale Devices
Lecture Notes in Electrical Engineering
Vo l u m e 5 8
puting with Nano-scale Devices
Chao Huang
ISBN 978-90-481-8539-9, 2010
Intelligent Automation puter Engineering
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Advances munication Systems and Electrical Engineering
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ISBN 978-0-387-74937-2, 2008
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ISBN 978-0-387-68835-0, 2007
Digital Noise Monitoring of Defect Origin
Telman Aliev
ISBN 978-0-387-71753-1, 2007
Multi-Carrier Spread Spectrum 2007
Simon Plass, Armin Dammann, Stefan Kaiser, and K. Fazel
ISBN 978-1-4020-6128-8, 2007
Chao Huang
Editor
puting
with Nano-scale Devices
Progresses and Challenges
1 3
Editor
Dr. Chao Huang
Virginia Tech
Bradley Dept. Electrical & Computer Engineering
302 Whittemore Hall
Blacksburg VA 24061
USA
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ISSN 1876-1100 e-ISSN 1876-1119
ISBN 978-90-481-8539-9 e-ISBN 978-90-481-8540-5
DOI -90-481-8540-5
Springer Dordrecht Heidelberg London New York
Library of Congress Control Number: 2010922792
c Springer Science+Business Media . 2010
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Contents
Introduction ........................................................................ 1
Chao Huang
Fault Tolerant puting ................................................... 7
Bharat Joshi, Dhiraj K. Pradhan, and Saraju P. Mohanty
I