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Transmission Electron Microscopy and Diffractometry of Materials.pdf

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文档介绍:Brent Fultz · James Howe
Transmission Electron Microscopy
and Diffractometry of Materials
High resolution transmission electron microscope (HRTEM) image of a lead crystal
between two crystals of aluminum (., a Pb precipitate at a grain boundary in
Al). The two crystals of Al have different orientations, evident from their di1erent
patterns of atom columns. Note mensurate atom matching of the Pb crystal
with the Al crystal at right, and mensurate atom matching at left. An isolated
Pb precipitate is seen to the right. The HRTEM method is the topic of Chapter 10.
Image courtesy of U. Dahmen, National Center for Electron Microscopy, Berkeley.
Brent Fultz · James Howe
TransmissionElectronMicroscopy
and Diffractometry of Materials
Third Edition
With 440 Figures and Numerous Exercises
123
Prof. Dr. Brent Fultz
California Institute of Technology
Materials Science and Applied Physics
MC 138-78
Pasadena
CA 91125
USA
******@
.edu/ matsci/btf/

University of Virginia
Department of Materials Science and Engineering
P. O. Box 400745
Charlottesville
VA22904-4745
USA
******@
/faculty/
Library of Congress Control Number: 2007933070
ISSN: 1439-2674
ISBN 978-3-540-73885-5 3rd Edition Springer Berlin Heidelberg New York
ISBN 978-3-540-43764-2 2nd Edition Springer Berlin Heidelberg New York
This work is subject to copyright. All rights are reserved, whether the whole or part of the material
is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broad-
casting, reproduction on microfilm or in any other way, and storage in data banks. Duplication of
this publication or parts thereof is permitted only under the provisions of the German Copyright Law
ofSeptember9,1965,initscurrentversion,andpermissionforusemustalwaysbeobtainedfrom
Springer. Violations are liable for prosecution under the German Copyright Law.
Springer is a part of Springer Scie