1 / 346
文档名称:

Recent Advances In Reliability And Quality Engineering (Hoang Pham Edt, World Scientific, 2001).pdf

格式:pdf   页数:346
下载后只包含 1 个 PDF 格式的文档,没有任何的图纸或源代码,查看文件列表

如果您已付费下载过本站文档,您可以点这里二次下载

Recent Advances In Reliability And Quality Engineering (Hoang Pham Edt, World Scientific, 2001).pdf

上传人:kuo08091 2014/5/16 文件大小:0 KB

下载得到文件列表

Recent Advances In Reliability And Quality Engineering (Hoang Pham Edt, World Scientific, 2001).pdf

文档介绍

文档介绍:Series on Quality, Reliability & Engineering Statistics
RECENT ADVANCES
IN RELIABILITY AND
QUALITY ENGINEERING
F i ( t )
1
til t 2 1 3 t
\ 1
) S 2 S 3
Editor
Hoang Pham
World Scientific
RECENT ADVANCES
IN RELIABILITY AND
QUALITY ENGINEERING
SERIES IN QUALITY, RELIABILITY & ENGINEERING STATISTICS
Series Editors: M. Xie (National University of Singapore)
T. Bendell (Nottingham Polytechnic)
A. P. Basu (University of Missouri)
Published
Vol. 4: Frontiers in Reliability
A. P. Basu, S. K. Basu & S. Mukhopadhyay
ing
Vol. 1: Reliability Optimization & Design of Fault Tolerant Systems
H. Pham
Vol. 3: Contributions to Reliability Analysis of Software & Computing Systems
P. K. Kapur& R. B. Garg
VOL 2 Series on Quality, Reliability & Engineering Statistics
RECENT ADVANCES
IN RELIABILITY AND
QUALITY ENGINEERING
Editor
Hoang Pham
Rutgers University
I
Vfe World Scientific
«• SinqaporeSingapore • New Jersey • London • Hong Kong
Published by
World Scientific Publishing Co. Pte. Ltd.
P O Box 128, Fairer Road, Singapore 912805
USA office: Suite IB, 1060 Main Street, River Edge, NJ 07661
UK office: 57 Shelton Street, Covent Garden, London WC2H 9HE
British Library Cataloguing-in-Publication Data
A catalogue record for this book is available from the British Library.
RECENT ADVANCES IN RELIABILITY AND QUALITY ENGINEERING
Copyright © 2001 by World Scientific Publishing Co. Pte. Ltd.
All rights reserved. This book or parts thereof, may not be reproduced in any form or by any means, electronic or
mechanical, including photocopying, recording or any information storage and retrieval system now known or to
be invented, without written permission from the Publisher.
For photocopying of material in this volume, please pay a copying fee through the Copyright Clearance Center,
Inc., 222 Rosewood Drive, Danvers, MA 01923, USA. In this case permission to photocopy is not required