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文档介绍

文档介绍:Lecture Notes puter Science 3832
Commenced Publication in 1973
Founding and Former Series Editors:
Gerhard Goos, Juris Hartmanis, and Jan van Leeuwen
Editorial Board
David Hutchison
Lancaster University, UK
Takeo Kanade
Carnegie Mellon University, Pittsburgh, PA, USA
Josef Kittler
University of Surrey, Guildford, UK
Jon M. Kleinberg
Cornell University, Ithaca, NY, USA
Friedemann Mattern
ETH Zurich, Switzerland
John C. Mitchell
Stanford University, CA, USA
Moni Naor
Weizmann Institute of Science, Rehovot, Israel
Oscar Nierstrasz
University of Bern, Switzerland
C. Pandu Rangan
Indian Institute of Technology, Madras, India
Bernhard Steffen
University of Dortmund, Germany
Madhu Sudan
Massachusetts Institute of Technology, MA, USA
Demetri Terzopoulos
New York University, NY, USA
Doug Tygar
University of California, Berkeley, CA, USA
Moshe Y. Vardi
Rice University, Houston, TX, USA
Gerhard Weikum
Max-Planck Institute puter Science, Saarbruecken, Germany
David Zhang Anil K. Jain (Eds.)
Advances
in Biometrics
International Conference, ICB 2006
Hong Kong, China, January 5-7, 2006
Proceedings
13
Volume Editors
David Zhang
The Hong Kong Polytechnic University, Department puting
Hung Hom, Kowloon, Hong Kong, China
E-mail:
Anil K. Jain
Michigan State University, Department puter Science and Engineering
3115 Engineering Building, East Lansing, MI 48824-1226, USA
E-mail: ******@
Library of Congress Control Number: 2005937781
CR Subject Classification (1998): , , , , ,
ISSN 0302-9743
ISBN-10 3-540-31111-4 Springer Berlin Heidelberg New York
ISBN-13 978-3-540-31111-9 Springer Berlin Heidelberg New York
This work is subject to copyright. All rights are reserved, whether the whole or part of the material is
concerned, specifically the rights of translation, reprinting, re-use of illustrations, recitation, broadcasting,
reproduction