文档介绍:ASSESSING FAULT MODEL AND TEST QUALITY
THE KLUWER INTERNATIONAL SERIES
IN ENGINEERING PUTER SCIENCE
VLSI, COMPUTER ARCIllTECfURE AND
DIGITAL SIGNAL PROCESSING
Consulting Editor
Jonathan Allen
Latest Titles
SubbaMIllUlge Coding,J. Woods, editor,
ISBN: 0-7923-9093-8
Luw-Noise Wide-BaM Amplijiers in BipolllrllM CMOS Technologies,
Z. , ,
ISBN: 0-7923-9096-2
Iterative Identijiclltion and Re~oration ofIlIUIges, R. , J. Biemond
ISBN: 0-7923-9097-0
VLSI Design works, U. iUmaeher, U. Ruckert
ISBN: 0-7923-9127-6
Design for Digitlll Sy~ems, T. H. Meng
ISBN: 0-7923-9128-4
HardWilre Annealing in Analog VLSI puting, B. W. Lee, B. J. Sheu
ISBN: 0-7923-9132-2
works aM Speech Processing, D. P. Morgan, Scofield
ISBN: 0-7923-9144-6
Silicon-Dn-Insularor Technology: Materitlls to VLSl, . Colinge
ISBN: 0-7923-9150-0
MicroWilve uctor Devices, S. Yngvesson
ISBN: 0-7923-9156-X
A Survey ofHigh-Level Synthesis Sy~ems, R. A. Walker, R. Camposano
ISBN: 0-7923-9158-6
Symbolic Ana~sis for Automll/ed Design ofAnalog Integrated Circuits,
G. Gielen, W. Sansen,
ISBN: 0-7923-9161-6
High-Level VLSI Synthesis, R. Camposano, W. Wolf,
ISBN: 0-7923-9159-4
Integrating Functional 11M Temporal Domains in Logic Design: The Filise Path
Problem aM its Implications, P. C. MeGeer, R. K. Brayton,
ISBN: 0-7923-9163-2
Neural Models and Algorithmsfor Digillli Te~ing, S. T. Chakradhar,
V. D. Agrawal, M. L. Bushnell,
ISBN: 0-7923-9165-9
Monte CuioDevice Simuilltion: FuU BaM 11M BeyoM, Karl Hess, editor
ISBN: 0-7923-9172-1
The Design municating Sy~ems: A Sy~em Engineering Approach,
. Koomen
ISBN: 0-7923-9203-5
Pllrallel Algorithms aM Architectures for DSP AppliclltiOns,
M. A. Bayoumi, editor
ISBN: 0-7923-9209-4
Digillli Speech Processing: Speech Coding, Synthesis aM Recognition
A. Nejat Inee, editor
ISBN: 0-7923-9220-5
ASSESSING FAULT M