文档介绍：Agilent
Fundamentals of RF and Microwave
Power Measurements (Part 2)
Power Sensors and Instrumentation
Application Note 1449-2
For user convenience, Agilent’s Fundamentals of RF and Microwave Power
Fundamentals of RF and
Microwave Power Measurements, Measurements (Part 1)
application note 64-1, literature Introduction to Power, History, Definitions, International
number 5965-6330E, has been Standards, and Traceability
updated and segmented into four AN 1449-1, literature number 5988-9213EN
technical subject groupings. The
following abstracts explain how the Part 1 introduces the historical basis for power measurements, and provides
total field of power measurement definitions for average, peak, plex modulations. This application
fundamentals is now presented. note overviews various sensor technologies needed for the diversity of test
signals. It describes the hierarchy of international power traceability, yield-
parison to national standards at worldwide National Measurement
Institutes (NMIs) like the . National Institute of Standards and
Technology. Finally, the theory and practice of power parison
procedures are examined with regard to transferring calibration factors and
uncertainties. A glossary is included which serves all four parts.
Fundamentals of RF and Microwave Power
Measurements (Part 2)
Power Sensors and Instrumentation
AN 1449-2, literature number 5988-9214EN
Part 2 presents all the viable sensor technologies required to exploit the
users’ wide range of unknown modulations and signals under test. It
explains the sensor technologies, and how they came to be to meet certain
measurement needs. Sensor choices range from the venerable thermistor to
the innovative thermocouple to more recent improvements in diode sensors.
In particular, clever variations of binations are presented, which
achieve ultra-wide dynamic range and square-law detection plex
modulations. New instrumentation technologies