文档介绍：IC 探针图像模式识别与测距技术研究中文摘要
IC 探针图像模式识别与测距技术研究
中文摘要
结合工业部门生产线的需要,论文以两类不同的 IC 探针为研究对象,分别对 IC
探针图像模式识别和测距技术进行了研究,并探讨了相应技术的实现方法。开发了基
于图像模式识别的探针自动检查软件系统和基于图像处理的探针间距测量软件。
在垂直式 IC 探针 X 射线图像模式识别方面:详细地分析了各种型号探针样本的
尺寸和形状特点,根据不同型号探针的形状特征,提出了识别每种型号探针的形状特
征参数,建立了探针特征数据库。论文以其中 3 个系类 16 种探针为例,详细介绍了
探针形状特征的提取方法。利用 MATLAB 开发了探针模式识别系统,实验表明该系
统能够实现图像抓取、预处理、特征提取、识别及报警功能。
在悬臂式 IC 探针间距测量方面:基于生产线上探针目标和背景的特点,研究了
适合于 IC 探针可见光图像的图像去噪、图像分割、形态学处理等预处理算法,有效
地去除了背景的干扰;根据探针二值图像的拓扑特征,设计了探针位置识别和间距测
量方法,并利用 VC++和 MATLAB GUIDE 编程实现了上述各方法,完成了探针间距
测量软件,该软件实现了图像抓取、图像标定、探针位置识别、探针间距测量、测量
结果数据保存等功能。

关键词:IC 探针图像;模式识别;间距测量;机器视觉;特征提取

作者:黄传霞
指导教师:赵勋杰

I
英文摘要 IC探针图像模式识别与测距技术研究
Image Recognition and Distance Measurement of IC Probes
Abstract
Combined with the needs of the production line in the industrial sector, this paper
takes two different kinds of IC probes as research objects, and respectively studies the
relevant techniques and methods of pattern recognition and distance measurement of the IC
probe images, with the development of the probe automatically check system which is
based on the image pattern recognition and the probe distance measurement software witch
is based on image processing.
In the aspect of the vertical type IC probe pattern recognition: the size and the shape
features of the probe samples belonging to different molds are analyzed in detail, the shape
feature parameters are proposed to recognize the different molds of probes according to
their shape features, and the probe feature database is established; this paper introduces a
probe shape feature extraction method in detail, with 16 molds of probes which belong to
three series as examples; probe pattern recognition system is developed using MATLAB,
and experiments indicate that the system has the functions of mage acquisition, image
preprocessing, feature extraction, pattern recognition and alarming.
In the aspect of the cantilever type IC probe distance