文档介绍：Physical Limitations of
Semiconductor Devices
. Vashchenko • . Sinkevitch
Physical Limitations of
Semiconductor Devices
. Vashchenko . Sinkevitch
National Semiconductor Pulsar R&D pany
Santa Clara, CA Moscow
USA Russia
Library of Congress Control Number: 2007942883
ISBN 978-0-387-74513-8 e-ISBN 978-0-387-74514-5
© 2008 Springer Science+Business Media, LLC
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Preface
Since the beginning of semiconductor era in microelectronics the methodology of
reliability assessment became a well established area. In most cases the reliability
assessment involves statistical methods for safe operating area and long term reli-
ability parameters at the development of semiconductor processes, components
and systems. At the same time in case of catastrop